Scan chain insertion, test point optimization, and DFT structural verification for manufacturing readiness.
Automated scan chain construction with balancing, lockup cells, and multi-clock support.
Strategic control and observe points to raise stuck-at and transition coverage.
Structural DRC, chain integrity, and rule checks before pattern generation.
Hand-off to Vectora ATPG/MBIST and existing synthesis / P&R environments.
Early access for teams building scan-ready silicon with high manufacturing yield goals.